Collect n samples, compute X-bar, SD(X-bar) = sigma/sqrt(n)
Draw pictures under null and under alternative
Rejection region defines alpha
Acceptance region defines beta under alternative
Goal:
want mu to be small so we can detect subtle differences
want alpha to be small so no type I errors
want beta to be small so no type II errors
want n to be small so we don't have to collect much data
Problem: ALL of these are playing agisnst each other
Picking n
The one sample problem. Is x-bar signficantly larger than a specified null value?
Alpha says how far away x-bar has to be to be significant
Beta for some delta says how far away x-bar has to be from interesting point
Draw picture on Z-scale
Put "real" scale underneath it
n determines ratio of two scales
Ah, now the details begin
delta = mu - mu0
Zalpha = required significance (alpha)
Zbeta = required power (beta)
Key equation: |Zalpha| + |Zalpha| = delta/SE
n = sigma2 (|Zalpha| + |Zalpha|)2/delta2
Easier problem: Find n to work with a confidence interval. n =
|Zalpha| sigma2 /(Interval width)2.
Depending how you define width, you many need a factor of 2 in here
also.
Picking all values
Need to pick all parameters.
Draw up table of type I and type II error
specify delta via economics (smallest profitable difference)
put costs on each error cell
If null is true, want small alpha, if alternative is true want
small beta, unfortunately, this would be self-confirming EVEN if it
weren't correct.